Linkall Technology (Hongkong) Limited

> EMC testing facility
Switzerland TESEQ testing facility
NEC EMC scanner
TESEO optic I/O
Langer PCB / IC level testing facility
EM TEST electrical performance test
EM TEST aircraft power test
High voltage test system
System EMC testing
Darkroom and shielding room

> Amplifier
CBA power amplifier
MILMEGA amplifier
IFI amplifier
AE Techron amplifier

> Information simulation test
Pendulum Time frequency
Pendulum pulse generator
Pendulum Linear amplifier
GPS
NI Software Defined Radio
Ettus Software Defined Radio

> Power electronics
Magna power DC power supply
NHR AC power supply and load
APC AC/DC power supply
CI AC power supply
EA bidirectional DC power supply
BOLAB Four quadrant power supply
American Digilent

> Semiconductor / chip
MEMS wafer level test system
Langer Chip EMC test system
Chip temperature test system
Chip TLP / electrostatic test
Semiconductor electrostatic control and risk analysis Germany ESTION

> Electromechanical
NEC IR camera
MCC data acquisition
CTC sensor
MEMS Vibration sensor
MB vibration test in USA
Edwin recorder
German laser vibrometer
Film pressure testing

> LINKALL Self-Developed
EV EMF test system
Electrostatic discharge test system
Lamp intelligent control system
Battery pack charging and discharging
EMP Effect test
EV Wireless charging test system
Automotive Speed sensor tester
Device intelligent diagnosis
Vibration modal analysis system
Vibration testing solutions